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參數(shù)資料
| 型號(hào)： | HS-26C(T)32RH |
| 廠商： | Intersil Corporation |
| 英文描述： | () |
| 中文描述： | （） |
| 文件頁數(shù)： | 4/4頁 |
| 文件大小： | 35K |
| 代理商： | HS-26C(T)32RH |
4-4
All Intersil semiconductor products are manufactured, assembled and tested under
ISO9000
quality systems certification.
Intersil semiconductor products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time with-
out notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site
www.intersil.com
Sales Office Headquarters
NORTH AMERICA
Intersil Corporation
P. O. Box 883, Mail Stop 53-204
Melbourne, FL 32902
TEL: (407) 724-7000
FAX: (407) 724-7240
TEL: (32) 2.724.2111
FAX: (32) 2.724.22.05
EUROPE
Intersil SA
Mercure Center
100, Rue de la Fusee
1130 Brussels, Belgium
ASIA
Intersil (Taiwan) Ltd.
7F-6, No. 101 Fu Hsing North Road
Taipei, Taiwan
Republic of China
TEL: (886) 2 2716 9310
FAX: (886) 2 2715 3029
FIGURE 6.
The active signal amplitude will be reduced by about 25%,
due to the resistive division, but the amplitude will still be
about 5-8X VTH(min), assuring adequate noise margin
and speed.
The HS-26C(T)31RH and HS-26C(T)32RH have been fully
characterized to 300KRAD total dose. A sample of each
wafer lot is evaluated to 300KRAD (Si) total dose, and
all post rad electricals (in accordance with the datasheet)
must pass.
In addition, Single Event Upset (SEU) and Single Event
Latch-up (SEL) testing on these two parts demonstrate that
the SEU and SEL thresholds are each >80 MEV/mg/cm
2
.
The testing was performed by NASA Goddard SFC, and is
published in the 1994 IEEE Radiation Effects Data Work-
shop. (IEEE publication # 94TH06841, “Single Event Effect
Proton and Heavy Ion Test Results for Candidate Spacecraft
Electronics”, by K. LaBel et al).
INP
INM
26C32MIN
OUT
1000
R19
R11
100
1000
R20
+
-
R15
1000
GND
Application Note 9520
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| HS-26C31RH-T | Radiation Hardened Quad Differential Line Receiver(抗輻射四路差分線接收器) |
| HS-26CLV31RH | Radiation Hardened 3.3V Quad Differential Line Driver |
| HS1-26CLV31RH-8 | Radiation Hardened 3.3V Quad Differential Line Driver |
| HS9-26CLV31RH-8 | Radiation Hardened 3.3V Quad Differential Line Driver |
| HS0-26CLV31RH-Q | Radiation Hardened 3.3V Quad Differential Line Driver |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| HS-26CT32RH-T | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Quad Differential Line Receiver |
| HS27 | 功能描述:散熱片 Heatsink, PSIP RoHS:否 制造商:Ampro By ADLINK 產(chǎn)品:Heat Sink Accessories 安裝風(fēng)格:Through Hole 散熱片材料: 散熱片樣式: 熱阻: 長度: 寬度: 高度: 設(shè)計(jì)目的:Express-HRR |
| HS-2700RH | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Low Power, High Performance Radiation Hardened Operational Amplifier |
| HS271 | 功能描述:散熱片 2.7 C/W PM Heat Sink 1 SSR RoHS:否 制造商:Ampro By ADLINK 產(chǎn)品:Heat Sink Accessories 安裝風(fēng)格:Through Hole 散熱片材料: 散熱片樣式: 熱阻: 長度: 寬度: 高度: 設(shè)計(jì)目的:Express-HRR |
| HS271DR | 功能描述:散熱片 2.7 C/W DIN RM Heat Sink - 1 SSR RoHS:否 制造商:Ampro By ADLINK 產(chǎn)品:Heat Sink Accessories 安裝風(fēng)格:Through Hole 散熱片材料: 散熱片樣式: 熱阻: 長度: 寬度: 高度: 設(shè)計(jì)目的:Express-HRR |
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