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參數資料
| 型號： | HS0-1840ARH-Q |
| 廠商： | INTERSIL CORP |
| 元件分類： | 運動控制電子 |
| 英文描述： | ER 4C 4#8 SKT RECP WALL |
| 中文描述： | 16-CHANNEL, SGL ENDED MULTIPLEXER, UUC26 |
| 封裝： | DIE-26 |
| 文件頁數： | 3/4頁 |
| 文件大小： | 76K |
| 代理商： | HS0-1840ARH-Q |
3
Burn-In/Life Test Circuits
NOTES:
V
S
+ = +15.5V
±
0.5V, V
S
- = -15.5V
±
0.5V.
R = 1k
±
5%.
C
1
= C
2
= 0.01
μ
F
±
10%, 1 each per socket, minimum.
D
1
= D
2
= 1N4002, 1 each per board, minimum.
Input Signals: square wave, 50% duty cycle, 0V to 15V peak
±
10%.
F1 = 100kHz; F2 = F1/2; F3 = F1/4; F4 = F1/8; F5 = F1/16.
FIGURE 1. DYNAMIC BURN-IN AND LIFE TEST CIRCUIT
NOTES:
R = 1k
±
5%,
1
/
4
W.
C
1
= C
2
= 0.01
μ
F minimum, 1 each per socket, minimum.
V
S
+ = 15.5V
±
0.5V, V
S
- = -15.5V
±
0.5V, V
R
= 15.5
±
0.5V.
FIGURE 2. STATIC BURN-IN TEST CIRCUIT
NOTES:
1. The above test circuits are utilized for all package types.
2. The Dynamic Test Circuit is utilized for all life testing.
Irradiation Circuit
HS-1840ARH
NOTE:
3. All irradiation testing is performed in the 28 lead CERDIP package.
R
R
GND
+V
S
R
28
27
26
25
24
23
22
21
20
19
18
17
16
15
1
2
3
4
5
6
7
8
9
10
11
12
13
14
F4
F3
F1
F5
F2
-V
S
10
11
12
13
14
28
27
26
25
24
23
22
21
20
19
18
17
16
15
1
2
3
4
5
6
7
8
9
R
R
R
GND
V
R
+V
S
R
-V
S
28
27
26
25
24
23
22
21
20
19
18
17
16
15
1k
+15V
+1V
+5V
NC
NC
-15V
1
2
3
4
5
6
7
8
9
10
11
12
13
14
HS-1840ARH
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PDF描述 |
|---|---|
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| HS1-54C138RH-8 | Radiation Hardened 3-Line to 8-Line Decoder/Demultiplexer |
| HS1-54C138RH-Q | Radiation Hardened 3-Line to 8-Line Decoder/Demultiplexer |
| HS0-82C12RH-Q | Radiation Hardened 8-Bit Input/Output Port |
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相關代理商/技術參數 |
參數描述 |
|---|---|
| HS01-A | 制造商:Eurotherm Inc 功能描述:HEAT SINK; Mounting Type:Din Rail |
| HS01B | 制造商:IDEC CORPORATION 功能描述:SENS.EFF.HALL D.9x40 mm PNP NO |
| HS01BEX | 制造商:IDEC CORPORATION 功能描述:SENS.EFF.HALL D.9x40 mm PNP NO |
| HS01F | 制造商:IDEC CORPORATION 功能描述:SENS.EFF.HALL D.9x40 mm PNP NO |
| HS01FEX | 制造商:IDEC CORPORATION 功能描述:SENS.EFF.HALL D.9x40 mm PNP NO |
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