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參數(shù)資料
| 型號： | MNLMH6628-X-RH |
| 廠商： | National Semiconductor Corporation |
| 英文描述： | DUAL WIDEBAND, LOW-NOISE, VOLTAGE FEEDBACK OP AMP, GUARANTEED TO 300k rd (si) TESTED TO MIL-STD-883, METHOD 1019 |
| 中文描述： | 雙寬帶，低噪聲，電壓反饋運(yùn)算放大器，保證30萬次（市）進(jìn)行測試，以符合MIL - STD - 883方法1019 |
| 文件頁數(shù)： | 1/12頁 |
| 文件大小： | 176K |
| 代理商： | MNLMH6628-X-RH |
Original Creation Date: 04/29/03
Last Update Date: 05/13/03
Last Major Revision Date:
MNLMH6628-X-RH REV 0A0
MICROCIRCUIT DATA SHEET
DUAL WIDEBAND, LOW-NOISE, VOLTAGE FEEDBACK OP AMP,
GUARANTEED TO 300k rd(Si) TESTED TO MIL-STD-883,
METHOD 1019
General Description
The National LMH6628 is a high speed dual op amp that offers a traditional voltage
feedback topology featuring unity-gain stability and slew-enhanced circuitry. The
LMH6628's low noise and very low harmonic distortion combine to form a very wide dynamic
range op amp that operates from a single (5 to 12V) or dual (+5V) power supply.
Each of the LMH6628's closely matched channels provides a 300MHz unity gain bandwidth and
low input voltage noise density (2nV/SqRtHz). Low 2nd/3rd harmonic distortion (-65/-74dBc
at 10MHz) makes the LMH6628 a perfect wide dynamic-range amplifier for matched I/Q
channels.
With its fast and accurate settling (12ns to 0.1%), the LMH6628 is also an excellent
choice for wide dynamic range, anti-aliasing filters to buffer the inputs of hi resolution
analog-to-digital converters. Combining the LMH6628's two tightly matched amplifiers in a
single package reduces cost and board space for many composite amplifier applications such
as active filters, differential line drivers/receivers, fast peak detectors and
instrumentation amplifiers.
The LMH6628 is fabricated using National's VIP 10 (TM) comlimentary bipolar process.
NS Part Numbers
LMH6628J-QML
LMH6628J-QMLV
LMH6628JFQML
LMH6628JFQMLV
LMH6628WG-QML
LMH6628WG-QMLV
LMH6628WGFQML
LMH6628WGFQMLV
Industry Part Number
LMH6628
Prime Die
LMH6628A
Controlling Document
SEE FEATURES SECTION
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-883, Method 5005
Subgrp Description Temp ( C)
1
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8A
8B
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Static tests at
Static tests at
Static tests at
Dynamic tests at
Dynamic tests at
Dynamic tests at
Functional tests at
Functional tests at
Functional tests at
Switching tests at
Switching tests at
Switching tests at
+25
+125
-55
+25
+125
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+25
+125
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+25
+125
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1
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