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參數(shù)資料
| 型號(hào)： | romr0008 |
| 廠商： | SIEMENS AG |
| 英文描述： | MultiMediaCard R0008 8 Mbyte ROM(多媒體卡 R0002 8 Mbyte ROM) |
| 中文描述： | 多媒體R0008 8字節(jié)的光盤（多媒體卡R0002 8字節(jié)光盤） |
| 文件頁數(shù)： | 37/41頁 |
| 文件大小： | 208K |
| 代理商： | ROMR0008 |
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Siemens
Product Manual R0008
Semiconductor Group
38
3.1
10.2.4
Operating characteristics
The operating characteristics are parameters measured in a MultiMediaCard system assuming the
recommended operating conditions (see "Chapter 10.2.3: Recommended operating conditions")
and the temperature range as defined in "Chapter 10.1: Temperature characteristics".
The guaranteed power consumption does not include the current consumed by external units.
All operating characteristics are measured assuming the following load model for each output:
The standard input capacity is C
card
=7pF. The standard bus capacitance is assumed to be
C
bus
=30pF. The maximum number of cards which can be driven in a MultiMediaCard stack at full
speed (20MHz) is 10. This leads to the following reference capacitance:
clock input rise time
clock input fall time
t
LH
t
HL
10
10
ns
ns
S. Figure 20
S. Figure 20
Parameter
Symbol
Min
Max
Unit
μ
A
Remark
Supply Current
I
DD
10
Standby state, Clock = 0Hz,
V
DD
= 2V, V
IH CMD,CLK
= V
DD
Supply Current
I
DD
200
μ
A
Transfer state, Clock = 400kHz,
V
DD
= 2V, V
IH CMD,CLK
= V
DD
V
IL CMD,CLK
= GND
Supply Current
I
DD
4
mA
Transfer state, Clock = 20MHz,
V
DD
= 2V, V
IH CMD,CLK
= V
DD
V
IL CMD,CLK
= GND
Supply Current
I
DD
8
mA
Transfer state, Clock = 20MHz,
V
DD
= 3.6V, V
IH CMD,CLK
= V
DD
V
IL CMD,CLK
= GND
Table 29: Guaranteed power consumption
Parameter
Symbol
Min
Max
Unit
Remark
All Digital Inputs
(Including I/O)
Input Leakage Current
I
LI
10
μ
A
0V < V
IN
< V
DD
All Outputs (push pull mode)
High-Level Output Voltage
Low-Level Output Voltage
V
OH
V
OL
0.75V
DD
V
V
at I
OHMIN
at I
OLMIN
0.125V
DD
Table 30: Operating characteristics
Parameter
Symbol
Min
Typ
Max
Unit
Remark
Table 28: Recommended Operating Conditions
C
L
10
n C
catd
C
bus
+
10 7
pF
30
pF
+
100
pF
=
=
=
Figure 19: Test circuit
card output
C
L
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