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參數資料
| 型號： | TPS53314RGFT |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | 穩壓器 |
| 英文描述： | SWITCHING REGULATOR, 1070 kHz SWITCHING FREQ-MAX, PQCC40 |
| 封裝： | 5 X 7 MM, GREEN, PLASTIC, VQFN-40 |
| 文件頁數： | 25/29頁 |
| 文件大小： | 800K |
| 代理商： | TPS53314RGFT |
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SLUSAK3
– MAY 2011
ELECTRICAL CHARACTERISTICS
Over recommended free-air temperature range, VDD = 12 V (Unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
LOGIC THRESHOLD AND SETTING CONDITIONS
Enable
1.8
V
VEN
EN voltage threshold
Disable
0.6
IEN
EN input current
VEN = 5 V
1.0
A
RRF = 0 Ω to GND, TA = 25°C
(1)
200
250
300
RRF = 187 kΩ to GND, TA = 25°C
(1)
250
300
350
RRF = 619 kΩ to GND, TA = 25°C
(1)
350
400
450
RRF = Open, TA = 25°C
(1)
450
500
550
fSW
Switching frequency
kHz
RRF = 866 kΩ to VREG, TA = 25°C
(1)
580
650
720
RRF = 309 kΩ to VREG, TA = 25°C
(1)
670
750
820
RRF = 124 kΩ to VREG, TA = 25°C
(1)
770
850
930
RRF = 0 Ω to VREG, TA = 25°C
(1)
880
970
1070
PROTECTION: CURRENT SENSE
ITRIP
TRIP source current
VTRIP = 1 V, TA = 25°C
9.4
10.0
10.6
A
TCITRIP
TRIP current temperature coefficent
On the basis of 25
°C(2)
4700
ppm/
°C
VTRIP
Current limit threshold setting range
VTRIP-GND voltage
0.2
0.6
V
VTRIP = 0.6 V
67
75
83
VOCL
Current limit threshold
VTRIP = 0.2
19
26
33
mV
VTRIP = 0.6 V
–83
–75
–67
VOCLN
Negative current limit threshold
VTRIP = 0.2 V
–33
–26
–19
Positive
3
15
VAZCADJ
Auto zero cross adjustable range
mV
Negative
–15
–3
PROTECTION: UVP and OVP
VOVP
OVP trip threshold
OVP detect
115%
120%
125%
tOVPDEL
OVP propagation delay time
VFB delay with 50-mV overdrive
1
s
VUVP
Output UVP trip threshold time
UVP detect
65%
70%
75%
tUVPDEL
Output UVP propagation delay time
0.8
1
1.2
ms
tUVPEN
Output UVP enable delay time
from EN to UVP workable, RMODE = 39 kΩ
2.0
2.6
3.2
ms
UVLO
Wake up
4.00
4.20
4.32
VUVVREG
VREG UVLO threshold
V
Hysteresis
0.25
THERMAL SHUTDOWN
Shutdown temperature(2)
145
TSDN
Thermal shutdown threshold
°C
Hysteresis(2)
10
(1)
Not production tested. Test condition is VIN = 12 V, VOUT= 1.1 V, IOUT= 5 A using application circuit shown in Figure 33.
(2)
Ensured by design. Not production tested.
Copyright
2011, Texas Instruments Incorporated
5
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