
ADM1021
–5–
REV. 0
FREQUENCY – Hz
10
050
50M
500
T
8
C
5k
50k
500k
5M
6
5
4
2
1
3
10mV SQ. WAVE
9
8
7
100k
25M
Figure 8. Temperature Error vs. Differential-Mode Noise
Frequency
CONVERSION RATE – Hz
200
0
0.0625
8
0.125
S
m
A
0.25
0.5
1
2
4
180
80
60
40
20
140
100
160
120
V
CC
= +5V
V
CC
= +3.3V
Figure 9. Operating Supply Current vs. Conversion
Rate
SUPPLY VOLTAGE – Volts
100
40
–200
1.1
S
m
A
1.3
1.5 1.7
1.9
2.1
2.3 2.5
2.7
2.9
3.5
4.5
80
60
20
0
ADDX = HI-Z
ADDX = GND
Figure 10. Standby Supply Current vs. Supply Voltage
TIME – Sec
125
100
0
T = 0
T = 10
T = 2
T
8
C
T = 4
T = 6
T = 8
75
50
25
IMMERSED
IN +115
C
FLUORINERT BATH
Figure 11. Response to Thermal Shock
FUNCTIONAL DESCRIPTION
The ADM1021 contains a two-channel A-to-D converter with
special input-signal conditioning to enable operation with remote
and on-chip diode temperature sensors. When the ADM1021 is
operating normally, the A-to-D converter operates in a free-
running mode. The analog input multiplexer alternately selects
either the on-chip temperature sensor to measure its local tem-
perature, or the remote temperature sensor. These signals are
digitized by the ADC and the results stored in the Local and
Remote Temperature Value Registers as 8-bit, twos complement
words.
The measurement results are compared with Local and Remote,
High and Low Temperature Limits, stored in four on-chip regis-
ters. Out-of-limit comparisons generate flags that are stored in
the status register, and one or more out-of-limit results will
cause the
ALERT
output to pull low.
The limit registers can be programmed, and the device con-
trolled and configured, via the serial System Management Bus.
The contents of any register can also be read back via the SMBus.
Control and configuration functions consist of:
Switching the device between normal operation and standby
mode.
Masking or enabling the
ALERT
output.
Selecting the conversion rate.
MEASUREMENT METHOD
A simple method of measuring temperature is to exploit the
negative temperature coefficient of a diode, or the base-emitter
voltage of a transistor, operated at constant current. Unfortu-
nately, this technique requires calibration to null out the effect
of the absolute value of V
be
, which varies from device to device.
The technique used in the ADM1021 is to measure the change
in V
be
when the device is operated at two different currents.
This is given by:
V
be
=
KT
/
q
×
ln
(
N
)
where:
K
is Boltzmann’s constant
q
is charge on the electron (1.6 x 10
–19
Coulombs)
T
is absolute temperature in Kelvins
N
is ratio of the two currents