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參數資料
型號: ADN2860
廠商: ANALOG DEVICES INC
元件分類: 數字電位計
英文描述: High Bandwidth, CMOS 8-Bit Serial Interface Multiplying D/A Converter; Package: MSOP; No of Pins: 10; Temperature Range: Industrial
中文描述: 250K DIGITAL POTENTIOMETER, 2-WIRE SERIAL CONTROL INTERFACE, 512 POSITIONS, QCC24
封裝: 4 X 4 MM, LFCSP-24
文件頁數: 5/15頁
文件大小: 1132K
代理商: ADN2860
Preliminary Technical Data
ADN2860ACP PIN CONFIGURATION
ADN2860
Page 5 of 15
PIN DESCRIPTIONS
#
Name
1
RESET
2
WP
Description
Reset the scratch pad register with current contents of the EEMEM register. Factory defaults midscale before any programming
Write Protect Pin. When active low,
WP
prevents any changes to the present register contents, except
PR
and cmd 1 and 8 will refresh the
RDAC register from EEMEM. Execute a NOP instruction before returning to
WP
high.
Serial Input Register clock pin. Shifts in one bit at a time on positive clock edges.
Serial Data Input Pin. Shifts in one bit at a time on positive clock CLK edges. MSB loaded first.
Ground pin, logic ground reference
Negative Supply. Connect to zero volts for single supply applications.
A terminal of RDAC2.
Wiper terminal of RDAC2
B terminal of RDAC2.
A terminal of RDAC1.
Wiper terminal of RDAC1
B terminal of RDAC1
A terminal of RDAC0.
Wiper terminal of RDAC0.
B terminal of RDAC0
Positive Power Supply Pin.
Test pin 3 (Do Not Connect)
Test pin 2 (Do Not Connect)
Test pin 1 (Do Not Connect)
Test pin 0 (Do Not Connect)
I2C Device Address 1 for EEMEM
I2C Device Address 0 for EEMEM
I2C Device Address 1 for RDAC
I2C Device Address 0 for RDAC
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
SCL
SDA
DGND
V
SS
A2
W2
B2
A1
W1
B1
A0
W0
B0
V
DD
TEST3
TEST2
TEST1
TEST0
A1_EE
A0_EE
AD1
AD0
REV. PrD
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