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參數資料
| 型號： | GS8640V36T-167 |
| 廠商： | GSI TECHNOLOGY |
| 元件分類： | DRAM |
| 英文描述： | 4M x 18, 2M x 32, 2M x 36 72Mb Sync Burst SRAMs |
| 中文描述： | 2M X 36 CACHE SRAM, 8 ns, PQFP100 |
| 封裝： | TQFP-100 |
| 文件頁數： | 14/23頁 |
| 文件大小： | 452K |
| 代理商： | GS8640V36T-167 |
GS8640V18/32/36T-300/250/200/167
Product Preview
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Rev: 1.00 9/2004
14/23
2004, GSI Technology
AC Test Conditions
Parameter
Conditions
V
DD
– 0.2 V
0.2 V
1 V/ns
V
DD
/2
V
DDQ
/2
Fig. 1
Input high level
Input low level
Input slew rate
Input reference level
Output reference level
Output load
Notes:
1.
2.
Include scope and jig capacitance.
Test conditions as specified with output loading as shown in
Fig. 1
unless otherwise noted.
Device is deselected as defined by the Truth Table.
3.
DC Electrical Characteristics
Parameter
Input Leakage Current
(except mode pins)
Symbol
Test Conditions
Min
Max
I
IL
V
IN
= 0 to V
DD
–
1 uA
1 uA
ZZ Input Current
I
IN1
V
DD
≥
V
IN
≥
V
IH
0 V
≤
V
IN
≤
V
IH
V
DD
≥
V
IN
≥
V
IL
0 V
≤
V
IN
≤
V
IL
Output Disable, V
OUT
= 0 to V
DD
I
OH
=
–
4 mA, V
DDQ
= 1.6 V
I
OL
= 4 mA, V
DD
= 1.6 V
–
1 uA
–
1 uA
1 uA
100 uA
FT Input Current
I
IN2
–
100 uA
–
1 uA
1 uA
1 uA
Output Leakage Current
I
OL
V
OH1
V
OL1
–
1 uA
1 uA
Output High Voltage
V
DDQ
– 0.4 V
—
Output Low Voltage
—
0.4 V
DQ
V
DDQ/2
50
30pF
*
Output Load 1
* Distributed Test Jig Capacitance
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相關代理商/技術參數 |
參數描述 |
|---|---|
| GS8640V36T-167I | 制造商:GSI 制造商全稱:GSI Technology 功能描述:4M x 18, 2M x 32, 2M x 36 72Mb Sync Burst SRAMs |
| GS8640V36T-200 | 制造商:GSI 制造商全稱:GSI Technology 功能描述:4M x 18, 2M x 32, 2M x 36 72Mb Sync Burst SRAMs |
| GS8640V36T-200I | 制造商:GSI 制造商全稱:GSI Technology 功能描述:4M x 18, 2M x 32, 2M x 36 72Mb Sync Burst SRAMs |
| GS8640V36T-250 | 制造商:GSI 制造商全稱:GSI Technology 功能描述:4M x 18, 2M x 32, 2M x 36 72Mb Sync Burst SRAMs |
| GS8640V36T-250I | 制造商:GSI 制造商全稱:GSI Technology 功能描述:4M x 18, 2M x 32, 2M x 36 72Mb Sync Burst SRAMs |
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