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參數資料
| 型號： | L9310 |
| 英文描述： | Line Interface and Line Access Circuit Full-Feature SLIC,Ringing Relay,and Test Access Device |
| 中文描述： | 線路接口和線路接入電路全功能用戶接口，振鈴繼電器，測試接入設備 |
| 文件頁數： | 22/60頁 |
| 文件大小： | 1053K |
| 代理商： | L9310 |
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Data Sheet
July 2001
Full-Feature SLIC, Ringing Relay, and Test Access Device
L9310 Line Interface and Line Access Circuit
22
Agere Systems Inc.
Electrical Characteristics
(continued)
Test
Table 8. ac Test Source
1. ac test signal should be ac coupled into TESTSIG.
2. A pull-down resistor to V
REF
should be connected to TESTSIG.
3. This parameter is not tested in production, it is guaranteed by design and characterization.
Table 9. Test Sense
1. This is the voltage coefficient with respect to tip/ring voltage. See Table 21 TESTLEV Output Options (Tip-to-Ring, Tip-to-Ground, and Ring-
to-Ground equations) for application of this parameter.
2. This parameter is not tested in production, it is guaranteed by design and characterization.
Parameter
Min
Typ
Max
Unit
Test Source
1, 2
:
Frequency (f1)
Signal Gain (TESTSIG to amplifier outputs) V
TESTSIG
= 0.35 V
Signal Gain Voltage Coefficient
Input Signal
Harmonic Distortion
3
—
—
—
0
—
—
10
1.27
—
—
100
—
—
1.25
5
kHz
—
1/V
Vrms
%
Parameter
Min
Typ
Max
Unit
Single-ended Voltage Gain ±10 V on Tip/Ring
Differential Voltage Gain ±10 V on Tip/Ring
Voltage Gain Accuracy (single-ended or differential)
Voltage Coefficient
Current Gain at VTX (dc) Differential
Current Gain at VTX (dc) Single-ended
Current Gain at VITR (ac) Differential
Current Gain at VITR (ac) Single-ended
Overload at VTX
2
Overload at VITR
2
V
REF
V
REF
Accuracy
TESTLEV Offset Relative to V
REF
TESTLEV Amplifier
Output Voltage Swing
Input Voltage Swing
—
—
–3.5
—
19.6
9.8
291
145.5
±105
±7
—
–5
–40
1/75
1/75
—
0.01
1
20
10
300
150
—
—
2.35
—
—
—
—
3.5
—
20.4
10.2
309
154.5
—
—
—
5
40
—
—
%
%/V
V/A
V/A
V/A
V/A
mA
mA
V
%
mV
AGND + 0.35
AGND + 0.35
—
—
V
CC
– 0.4
V
CC
– 1.0
V
V
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