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參數(shù)資料
型號: THS1206QDAR
廠商: TEXAS INSTRUMENTS INC
元件分類: ADC
英文描述: 4-CH 12-BIT PROPRIETARY METHOD ADC, PARALLEL ACCESS, PDSO32
封裝: PLASTIC, TSSOP-32
文件頁數(shù): 19/43頁
文件大小: 722K
代理商: THS1206QDAR
THS1206
SLAS217H – MAY 1999 – REVISED JULY 2003#
www.ti.com
26
ANALOG INPUT CHANNEL SELECTION
The analog input channels of the THS1206 can be selected via bits 3 to 7 of control register 0. One single channel
(single-ended or differential) is selected via bit 3 and bit 4 of control register 0. Bit 5 controls the selection between
single-ended and differential configuration. Bit 6 and bit 7 select the autoscan mode, if more than one input channel is
selected. Table 10 shows the possible selections.
Table 10. Analog Input Channel Configurations
BIT 7
SCAN
BIT 6
DIFF1
BIT 5
DIFF0
BIT 4
CHSEL1
BIT 3
CHSEL0
DESCRIPTION OF THE SELECTED INPUTS
0
Analog input AINP (single ended)
0
1
Analog input AINM (single ended)
0
1
0
Analog input BINP (single ended)
0
1
Analog input BINM (single ended)
0
1
0
Differential channel (AINP–AINM)
0
1
0
1
Differential channel (BINP–BINM)
1
0
1
Autoscan two single ended channels: AINP, AINM, AINP,
1
0
1
0
Autoscan three single ended channels: AINP, AINM, BINP, AINP,
1
0
1
Autoscan four single ended channels: AINP, AINM, BINP, BINM, AINP,
1
0
1
0
1
Autoscan one differential channel and one single ended channel AINP, (BINP–BINM),
AINP, (BINP–BINM),
1
0
1
0
Autoscan one differential channel and two single ended channel AINP, AINM, (BINP–
BINM), AINP,
1
0
1
Autoscan two differential channels (AINP–AINM), (BINP–BINM), (AINP–AINM),
0
1
0
Reserved
0
1
Reserved
1
0
Reserved
1
0
1
0
Reserved
1
0
1
Reserved
1
0
Reserved
1
0
1
0
Reserved
1
0
1
Reserved
1
0
Reserved
1
0
1
Reserved
1
0
Reserved
1
Reserved
Test Mode
The test mode of the ADC is selected via bit 8 and bit 9 of control register 0. The different selections are shown in Table 11.
Table 11. Test Mode
BIT 9
TEST1
BIT 8
TEST0
OUTPUT RESULT
0
Normal mode
0
1
VREFP
1
0
((VREFM)+(VREFP))/2
1
VREFM
Three different options can be selected. This feature allows support testing of hardware connections between the ADC and
the processor.
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