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參數資料
| 型號： | AD9444 |
| 廠商： | Analog Devices, Inc. |
| 英文描述： | 14-Bit, 80 MSPS, A/D Converter |
| 中文描述： | 14位，80 MSPS的，A / D轉換 |
| 文件頁數： | 9/40頁 |
| 文件大?。?/td> | 1291K |
| 代理商： | AD9444 |
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AD9444
DEFINITIONS OF SPECIFICATIONS
Analog Bandwidth (Full Power Bandwidth)
The analog input frequency at which the spectral power of the
fundamental frequency (as determined by the FFT analysis) is
reduced by 3 dB.
Rev. 0 | Page 9 of 40
Aperture Delay (t
A
)
The delay between the 50% point of the rising edge of the clock
and the instant at which the analog input is sampled.
Aperture Uncertainty (Jitter, t
J
)
The sample-to-sample variation in aperture delay.
Clock Pulse Width and Duty Cycle
Pulse width high is the minimum amount of time that the
clock pulse should be left in the Logic 1 state to achieve rated
performance. Pulse width low is the minimum time the clock
pulse should be left in the low state. At a given clock rate, these
specifications define an acceptable clock duty cycle.
Differential Nonlinearity (DNL, No Missing Codes)
An ideal ADC exhibits code transitions that are exactly 1 LSB
apart. DNL is the deviation from this ideal value. Guaranteed no
missing codes to 14-bit resolution indicates that all 16384 codes
must be present over all operating ranges.
Effective Number of Bits (ENOB)
The effective number of bits for a sine wave input at a given
input frequency can be calculated directly from its measured
SINAD using the following formula
(
)
6.02
1.76
=
SINAD
ENOB
Gain Error
The first code transition should occur at an analog value LSB
above negative full scale. The last transition should occur at an
analog value 1 LSB below the positive full scale. Gain error is
the deviation of the actual difference between first and last code
transitions and the ideal difference between first and last code
transitions.
Integral Nonlinearity (INL
)
The deviation of each individual code from a line drawn from
negative full scale through positive full scale. The point used as
negative full scale occurs LSB before the first code transition.
Positive full scale is defined as a level 1 LSBs beyond the last
code transition. The deviation is measured from the middle of
each particular code to the true straight line.
Maximum Conversion Rate
The clock rate at which parametric testing is performed.
Minimum Conversion Rate
The clock rate at which the SNR of the lowest analog signal
frequency drops by no more than 3 dB below the guaranteed
limit.
Offset Error
The major carry transition should occur for an analog value
LSB below VIN+ = VIN. Offset error is defined as the
deviation of the actual transition from that point.
Out-of-Range Recovery Time
The time it takes for the ADC to reacquire the analog input
after a transition from 10% above positive full scale to 10%
above negative full scale, or from 10% below negative full scale
to 10% below positive full scale.
Output Propagation Delay (t
PD
)
The delay between the clock rising edge and the time when all
bits are within valid logic levels.
Power-Supply Rejection Ratio
The change in full scale from the value with the supply at the
minimum limit to the value with the supply at its maximum limit.
Signal-to-Noise and Distortion (SINAD)
The ratio of the rms input signal amplitude to the rms value of
the sum of all other spectral components below the Nyquist
frequency, including harmonics but excluding dc.
Signal-to-Noise Ratio (SNR)
The ratio of the rms input signal amplitude to the rms value of
the sum of all other spectral components below the Nyquist
frequency, excluding the first six harmonics and dc.
Spurious-Free Dynamic Range (SFDR)
The ratio of the rms signal amplitude to the rms value of the
peak spurious spectral component. The peak spurious compo-
nent may or may not be a harmonic. May be reported in dBc
(i.e., degrades as signal level is lowered) or dBFS (always related
back to converter full scale).
Temperature Drift
The temperature drift for offset error and gain error specifies
the maximum change from the initial (25°C) value to the value
at T
MIN
or T
MAX
.
Total Harmonic Distortion (THD)
The ratio of the rms input signal amplitude to the rms value of
the sum of the first six harmonic components.
Two-Tone SFDR
The ratio of the rms value of either input tone to the rms value
of the peak spurious component. The peak spurious component
may or may not be an IMD product.
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相關代理商/技術參數 |
參數描述 |
|---|---|
| AD9444BSVZ-80 | 功能描述:IC ADC 14BIT 80MSPS 100TQFP RoHS:是 類別:集成電路 (IC) >> 數據采集 - 模數轉換器 系列:- 其它有關文件:TSA1204 View All Specifications 標準包裝:1 系列:- 位數:12 采樣率（每秒）:20M 數據接口:并聯 轉換器數目:2 功率耗散（最大）:155mW 電壓電源:模擬和數字 工作溫度:-40°C ~ 85°C 安裝類型:表面貼裝 封裝/外殼:48-TQFP 供應商設備封裝:48-TQFP（7x7） 包裝:Digi-Reel® 輸入數目和類型:4 個單端，單極；2 個差分，單極 產品目錄頁面:1156 (CN2011-ZH PDF) 其它名稱:497-5435-6 |
| AD9444-CMOS/PCB | 制造商:Analog Devices 功能描述:Evaluation Kit For 14-Bit, 80 MSPS, A/D Converter |
| AD9444-CMOSPCB | 制造商:AD 制造商全稱:Analog Devices 功能描述:High Speed ADC USB FIFO Evaluation Kit |
| AD9444-LVDS/PCB | 制造商:Analog Devices 功能描述:14-BIT, 80 MSPS ADC PB FREE EVAL BD. - Trays |
| AD9444-LVDS/PCBZ | 制造商:Analog Devices 功能描述:LVDS Mode Evaluation Board 制造商:Analog Devices 功能描述:14-BIT, 80 MSPS ADC EVAL BD. - Bulk |
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