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參數資料
型號: ADM1027ARQZ-RL7
廠商: ON Semiconductor
文件頁數: 39/56頁
文件大小: 1822K
描述: IC REMOTE THERMAL CTLR 24QSOP
產品變化通告: MFG CHG Notification ADI to ON Semi
Product Discontinuation Notice 25/Aug/2008
Product Obsolescence 30/Sept/2009
標準包裝: 1,000
系列: dBCool®
功能: 風扇控制,溫度監控器
傳感器類型: 內部和外部
感應溫度: 0°C ~ 105°C,外部傳感器
精確度: ±1°C
拓撲: ADC,比較器,風扇速度計數器,多路復用器,寄存器庫
輸出類型: SMBus?
輸出警報:
輸出風扇:
電源電壓: 3 V ~ 5.5 V
工作溫度: 0°C ~ 105°C
安裝類型: 表面貼裝
封裝/外殼: 24-SSOP(0.154",3.90mm 寬)
供應商設備封裝: 24-QSOP
包裝: 帶卷 (TR)
REV. A
ADM1027
39
OPERATING FROM 3.3 V STANDBY
The ADM1027 has been specifically designed to operate from a
3.3 V STBY supply. In computers that support S3 and S5 states,
the core voltage of the processor will be lowered in these states.
Note that since other voltages can drop or be turned off during
a low power state, these voltage channels will set status bits or
generate SMBALERTs. It is still necessary to mask out these
channels prior to entering a low power state by using the interrupt
mask registers. When exiting the low power state, the mask bits
can be cleared. This prevents the device from generating unwanted
SMBALERTs during the low power state.
XOR TREE TEST MODE
The ADM1027 includes an XOR tree test mode. This mode is
useful for in-circuit test equipment at board-level testing. By
applying stimulus to the pins included in the XOR tree, it is
possible to detect opens or shorts on the system board. Figure 43
shows the signals that are exercised in the XOR tree test mode.
The XOR tree test is invoked by setting Bit 0 (XEN) of the
XOR tree test enable register (Reg. 0x6F).
PWM1/XTO
PWM3
PWM2
TACH4
TACH3
TACH2
TACH1
VID4
VID3
VID2
VID1
VID0
Figure 43. XOR Tree Test
Rev. 3 | Page 39 of 56 | www.onsemi.com
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