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參數資料
型號: TS86101G2BCGL
廠商: E2V TECHNOLOGIES PLC
元件分類: DAC
英文描述: PARALLEL, WORD INPUT LOADING, 10-BIT DAC, CBGA255
封裝: HERMETIC SEALED, CERAMIC, BGA-255
文件頁數: 57/57頁
文件大小: 1030K
代理商: TS86101G2BCGL
9
0992D–BDC–04/09
e2v semiconductors SAS 2009
TS86101G2B
2.3
Explanation of Test Levels
Notes:
1. The level 1 and 2 tests are performed at 100 Msps (600 Msps for SFDR performance).
2. Only MIN and MAX values are guaranteed (typical values are issued from characterization results).
3.
Typical Characteristics
The device’s typical characteristics are the following, unless stated otherwise:
T
J = 85°C, VCCD = 5V, VEEA = –5V, VEED = –5V
100
Ω differential output, 0 dBFS = 7 dBm
Full-scale analog output voltage = 2 Vpp if (50
Ω // 2pF) × 2 differentially-terminated
SFDR up to Nyquist
Figure 3-1.
SFDR at Fs = 1.2 Gsps Against Output Level in Nyquist Conditions (Fout = 575 MHz)
Notes:
1. SFDR performance (expressed in dBc) is optimum near –6 dBFS.
2. SFDR performance (expressed in dBFS) is quasi-constant for output levels below –6 dBFS. This means that the level of
spurs remains quasi-unchanged when lowering the amplitude of the fundamental.
3. SFDR is the ratio of the magnitude of the first (main) harmonic and the highest other harmonic measured over the frequency
band DC to Fs/2.
4. In single-ended operation, 0 dBFS = full-scale = 1 Vpp = 0.5V peak over 50
Ω = –6 dBV = 4 dBm. In differential mode,
0 dBFS = full-scale = 2 Vpp = 0.707 V peak over 100
Ω = –3 dBV = 7 dBm.
5. The power level at the DAC’s output is given by both the digital sinusoidal input level (dBFS) and the theoretical sin X/X devi-
ation, which is Fout-dependent. For example, considering the SFDR with a –10 dBFS digital sinusoidal input and Fout = 499
MHz, Fs = 1 Gsps, the differential output power level of the single tone at Fout = 499 MHz is –6.9 dBm (–10 dBFS = –3 dBm
and the theoretical deviation of sin X/X is –3.9 dB in Nyquist).
Table 2-5.
Explanation of Test Levels
Num
Characteristics
1
100% production tested at +25
°C(1)
2
100% production tested at +25
°C, and sample tested at specified temperatures(1)
3
Sample tested only at specified temperatures
4
Parameter is guaranteed by design and characterization testing (thermal steady-state conditions at specified
temperature)
5
Parameter is a typical value only
45
50
55
60
-1
6
-1
5
-1
4
-1
3
-1
2
-1
1
-1
0
-9
-8
-7
-6
-5
-4
-3
-2
-1
0
Output Level (dBFS)
S
F
DR
(
d
Bc)
Output Level (dBFS)
SF
D
R
(d
B
F
S)
50
55
60
65
70
-1
6
-1
5
-1
4
-1
3
-1
2
-1
1
-1
0
-9
-8
-7
-6
-5
-4
-3
-2
-1
0
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