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參數資料
| 型號： | TSC2008TRGVRQ1 |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | 消費家電 |
| 英文描述： | SPECIALTY CONSUMER CIRCUIT, PQCC16 |
| 封裝： | 4 X 4 MM, PLASTIC, VQFN-16 |
| 文件頁數： | 12/35頁 |
| 文件大?。?/td> | 418K |
| 代理商： | TSC2008TRGVRQ1 |
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SBAS552
– JUNE 2011
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION(1)
TA
PACKAGE
ORDERABLE PART NUMBER
TOP-SIDE MARKING
–40°C to 105°C
QFN - RGV
Tape and Reel
TSC2008TRGVRQ1
TSC2008T
(1)
For the most current package and ordering information, see the Package Option Addendum located at the end of this data sheet, or see
the TI website at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
(1)
Over operating free-air temperature range (unless otherwise noted).
PARAMETER
TSC2008-Q1
UNIT
Analog input X+, Y+, AUX to GND
–0.4 to VDD + 0.1
V
Voltage
Analog input X
–, Y– to GND
–0.4 to VDD + 0.1
V
Voltage range
VDD to GND
–0.3 to +5
V
Digital input voltage to GND
–0.3 to VDD + 0.3
V
Digital output voltage to GND
–0.3 to VDD + 0.3
V
Power dissipation
(TJ Max - TA)/θJA
Thermal impedance,
θJA
QFN package
47
°C/W
Operating free-air temperature range, TA
–40 to +105
°C
Storage temperature range, TSTG
–65 to +150
°C
Junction temperature, TJ Max
+150
°C
Vapor phase (60 sec)
+215
°C
Lead temperature
Infrared (15 sec)
+220
°C
IEC contact discharge(2)
X+, X
–, Y+, Y–
±15
kV
IEC air discharge(2)
X+, X
–, Y+, Y–
±25
kV
(1)
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated is not implied. Exposure to
absolute-maximum rated conditions for extended periods may affect device reliability.
(2)
Test method based on IEC standard 61000-4-2. Device powered by battery. Contact Texas Instruments for test details.
2
Copyright
2011, Texas Instruments Incorporated
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