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參數資料
型號: TSB41LV03PFP
英文描述: IC APEX 20KE FPGA 600K 652-BGA
中文描述: 收發器
文件頁數: 14/50頁
文件大小: 662K
代理商: TSB41LV03PFP
SLLS418G
JUNE 2000
REVISED JANUARY 2003
14
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended ranges of operating conditions (unless otherwise noted)
(continued)
thermal characteristics
PARAMETER
TEST CONDITION
MIN
TYP
MAX
UNIT
R
θ
JA
Junction-to-ambient thermal resistance
Board mounted, no air flow, high conductivity TI
recommended test board chip soldered or greased to
recommended test board, chip soldered or greased to
thermal land with 2 oz. copper
19.04
°
C/W
R
θ
JC
Junction-to-case thermal resistance
0.17
°
C/W
R
θ
JA
Junction-to-ambient thermal resistance
Board mounted, no air flow, high conductivity TI
recommended test board with thermal land but no solder
or grease thermal connection to thermal land with 2 oz.
copper
31.52
°
C/W
R
θ
JC
Junction-to-case-thermal resistance
0.17
°
C/W
R
θ
JA
R
θ
JC
Junction-to-ambient thermal resistance
Junction-to-case-thermal resistance
Board mounted, no air flow, high conductivity JEDEC test
board with 1 oz. copper
49.17
3.11
°
C/W
°
C/W
switching characteristics
PARAMETER
TEST CONDITION
MIN
TYP
MAX
±
0.15
±
0.1
1.2
UNIT
Jitter, transmit
Between TPA and TPB
ns
Skew, transmit
Between TPA and TPB
ns
tr
tf
tsu
th
td
Test Conditions: 3.3 VCC, TA
= 25
°
C
TP differential rise time, transmit
10% to 90%,
At 1394 connector
0.5
ns
TP differential fall time, transmit
90% to 10%,
At 1394 connector
0.5
1.2
ns
Setup time, CTL0, CTL1, D1
D7, LREQ to SYSCLK
50% to 50%,
See Figure 2
5
ns
Hold time, CTL0, CTL1, D1
D7, LREQ after SYSCLK
50% to 50%,
See Figure 2
2
ns
Delay time, SYSCLK to CTL0, CTL1, D1
D7
50% to 50%,
See Figure 3
2
ns
PARAMETER MEASUREMENT INFORMATION
TPAx+
TPBx+
TPAx
TPBx
56
Figure 1. Test Load Diagram
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