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參數(shù)資料
型號(hào)： ADE7169ACPZF16
廠商： ANALOG DEVICES INC
元件分類： 模擬信號(hào)調(diào)理
英文描述： Single-Phase Energy Measurement IC with 8052 MCU, RTC and LCD driver
中文描述： SPECIALTY ANALOG CIRCUIT, QCC64
封裝： 9 X 9 MM, ROHS COMPLIANT, MO-22-VMMD-4, LFCSP-64
文件頁數(shù)： 18/140頁
文件大小： 1359K
代理商： ADE7169ACPZF16
ADE7169F16
Preliminary Technical Data
ABSOLUTE MAXIMUM RATINGS
T
A
= 25°C, unless otherwise noted.
Table 9.
Parameter
V
DD
to DGND
V
BAT
to DGND
V
DCIN
to DGND
Input LCD voltage to AGND
LCDVA, LCDVB, LCDVC
1
Analog Input Voltage to AGND
V
P
, V
N
, I
AP
, I
BPN
and I
N
Digital Input Voltage to DGND
Digital Output Voltage to DGND
Operating Temperature Range
Industrial
Storage Temperature Range
Junction Temperature
64-Lead LQFP, Power Dissipation
θ
JA
Thermal Impedance
Lead Temperature, Soldering
Vapor Phase (TBD sec)
Infrared (TBD sec)
64-Lead CSP, Power Dissipation
θJA Thermal Impedance
Lead Temperature, Soldering
Vapor Phase (TBD sec)
Infrared (TBD sec)
Rev. PrD | Page 18 of 140
Rating
–0.3 V to +3.7 V
–0.3 V to +3.7 V
–0.3 V to V
SWOUT
+ 0.3 V
–0.3 V to V
SWOUT
+ 0.3 V
–2 V to +2 V
–0.3 V to V
SWOUT
+ 0.3 V
–0.3 V to V
SWOUT
+ 0.3 V
–40°C to +85°C
–65°C to +150°C
TBD°C
TBD
TBD°C/W
TBD°C
TBD°C
TBD
TBD°C/W
TBD°C
TBD°C
1
When used with external resistor divider
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or
any other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
相關(guān)PDF資料
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