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參數資料
| 型號： | THS8083APZPG4 |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | 消費家電 |
| 英文描述： | SPECIALTY CONSUMER CIRCUIT, PQFP100 |
| 封裝： | GREEN, PLASTIC, HTQFP-100 |
| 文件頁數： | 42/63頁 |
| 文件大小： | 320K |
| 代理商： | THS8083APZPG4 |
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64
6.4.4
I2C Interface
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VIL
Low-level input voltage
0.99
V
VIH
High-level input voltage
2.31
V
f(SCL)
SCL clock frequency
0
400/100
kHz
t(LOW)
Low period of SCL
Valid for I2C fast mode support only.
1.3
s
t(HIGH)
High period of SCL
Valid for I2C fast mode support only.
See footnotes to SCL clock frequency.
0.6
s
th(DATA)
Data hold time
0§
s
tsu(DATA)
Data setup time
100
s
C(b)
Capacitive load for each bus line#
400
pF
For DTO clock frequencies 25 MHz minimum (I2C fast mode)
For DTO clock frequencies below 25 MHz (I2C normal mode)
§ The device must internally provide a hold time of 300 ns for the SDA signal (referred to VIH(min) of the SCL signal) in order to bridge the undefined
region of the falling edge of SCL.
If the device is used in a standard mode I2C system, the requirement of tsu(DATA)>=250 ns must be met.
# Cb= total capacitance of one bus line in pF
6.4.5
ADC Channel
6.4.5.1 DC Accuracy
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Integral nonlinearity (INL)
PLL (see Note 7)
2
±1
2
LSB
Integral nonlinearity (INL)
PLL (see Note 7)
2
±1
2
LSB
Differential nonlinearity (DNL)
PLL (see Note 8)
1
1.5
LSB
Differential nonlinearity (DNL)
PLL (see Note 8)
1
1.5
LSB
No missing codes
Assured
Gain error
ADC_INTREF (see Note 9)
60
mV
Offset error
ADC_INTREF (see Note 10)
60
mV
Assured at nominal voltage supply levels only.
NOTES:
7. Integral nonlinearity (INL) —Integral nonlinearity refers to the deviation of each individual code from a line drawn from zero to full
scale. The point used as zero occurs 1/2 LSB before the first code transition. The full-scale point is defined as a level 1/2 LSB beyond
the last code transition. The deviation is measured from the center of each particular code to the true straight line between these
two end points.
8. Differential nonlinearity (DNL)—An ideal ADC exhibits code transitions that are exactly 1 LSB apart. DNL is the deviation from this
ideal value. Therefore, this measure indicates how uniform the transfer function step sizes are. The ideal step size is defined here
as the step size for the device under test (i.e., last transition level first transition level)/(2n 2). Using this definition for DNL
separates the effects of gain and offset error. A DNL of less than
±1 LSB ensures no missing codes. A DNL of less than ±1/2 LSB
assures monotonic behavior.
9. Gain error—The first code transition should occur for an analog value 1/2 LSB above nominal negative full scale (the voltage applied
to the REFBI terminal). The last transition should occur for an analog value 1/2 LSB below nominal positive full scale (the voltage
applied to the REFTI terminal). Gain error is defined here as the deviation from the ideal location of the highest transition level on
the ADC transfer function.
10. Offset error—The first code transition should occur at a level 1/2 LSB above zero. Offset is defined as the deviation of the actual
first code transition from that point.
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