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| 型號： | AFE7222EVM |
| 廠商： | Texas Instruments |
| 文件頁數： | 14/106頁 |
| 文件大小： | 0K |
| 描述： | EVAL MODULE FOR AFE7222 |
| 標準包裝： | 1 |
| 主要目的： | 接口，模擬前端（AFE） |
| 嵌入式： | 否 |
| 已用 IC / 零件： | AFE7222 |
| 已供物品： | 板 |
| 其它名稱： | 296-30300 AFE7222EVM-ND |
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SLOS711B – NOVEMBER 2011 – REVISED MARCH 2012
3.11
TIMING REQUIREMENTS
Typical values at TA = 25°C, full temperature range is TMIN = –40°C to TMAX = 85°C, unless otherwise noted.
AFE7222
AFE7225
PARAMETER
TEST CONDITIONS
UNIT
MIN
TYP
MAX
MIN
TYP
MAX
SCLK INPUT
tSCLK
CLOCK period
25
ns
tSCLKH
CLOCK pulse width high
12.5
ns
Assuming 50/50 duty cycle
tSCLKL
CLOCK pulse width low
12.5
ns
3.12
TIMING REQUIREMENTS FOR RECEIVE PATH – LVDS AND CMOS MODES
Typical values are at 25°C, AVDD3_DAC = 3.0 V, AVDD3_AUX = 3.0 V, AVDD18_ADC = 1.8 V, DVDD18_CLK = 1.8 V,
DVDD18_DAC = 1.8 V, DVDD18 = 1.8 V, sampling frequency = 125 MSPS, sine wave input clock, 1.5 Vpp clock amplitude,
CLOAD = 5 pF
(1), R
LOAD = 100 Ω
(2), unless otherwise noted. Min and max values are across the full temperature range T
MIN = -
40°C to TMAX = 85°C, AVDD3_DAC = 3.0 V, AVDD3_AUX = 3.0 V, AVDD18_ADC = 1.8 V, DVDD18_CLK = 1.8 V,
DVDD18_DAC = 1.8 V, DVDD18 = 1.7 V to 1.9 V
PARAMETER
TEST CONDITIONS
MIN
TYP MAX
UNIT
TA
Aperture delay
2
ns
Aperture delay matching
Between two channels on the same device
±120
ps
Aperture delay matching
Between two devices at same temperature and DVDD18 supply
±450
ps
Jitter added by internal clock distribution, specified as it relates
TJ
Aperture jitter
250
fs rms
to the receive ADC
Default Mode
16
Mixer Enabled (RX_MIXER_EN = 1)
33
clock
ADC Latency(3)
cycles
RX QMC Gain Phase Correction Enabled
22
(RX_QMC_CORR_ENA=1, RX_QMC_CORR_ENB=1)
LVDS OUTPUT INTERFACE
2-WIRE MODE, DDR CLOCK(4), Sampling frequency = 125MSPS
tsu
Data setup time (5)
Data valid(5) to zero-crossing of CLKOUTP
0.29
0.42
ns
th
Data hold time (5)
Zero-crossing of CLKOUTP to data becoming invalid (5)
0.3
0.47
ns
tPDI
Clock propagation delay
Input clock rising edge cross-over to output clock rising edge
tPDI = tDELAY
ns
cross-over 10 MSPS
≤ Sampling frequency ≤ 125 MSPS Ts =
tdelay
11.5
13.8
15.5
ns
1/Sampling frequency
Variation of tdelay
Between two devices at same temperature and DVDD18 supply
±300
ps
Duty cycle of differential clock, (ADC_DCLKOUTP-
LVDS bit clock duty cycle
ADC_DCLKOUTM) 10 MSPS
≤ Sampling frequency ≤ 125
50%
MSPS
2-WIRE MODE, SDR CLOCK(4), Sampling frequency = 65MSPS
tsu
Data setup time (5)
Data valid (5) to zero-crossing of CLKOUTP
0.85
1.08
ns
th
Data hold time (5)
Zero-crossing of CLKOUTP to data becoming invalid (5)
1.08
1.21
ns
Input clock rising edge cross-over to output clock rising edge
tPDI
Clock propagation delay
cross-over 10 MSPS
≤ Sampling frequency ≤ 65 MSPS Ts =
tPDI = 0.5*Ts + tDELAY
ns
1/Sampling frequency
tdelay
11.5
14
16.5
ns
Variation of tdelay
Between two devices at same temperature and DVDD18 supply
±300
ps
Duty cycle of differential clock, (CLKOUTP-CLKOUTM) 10
LVDS bit clock duty cycle
50%
MSPS
≤ Sampling frequency ≤ 65 MSPS
1-WIRE MODE (DDR CLOCK ONLY)(4), Sampling frequency = 65MSPS
tsu
Data setup time (5)
Data valid (5) to zero-crossing of CLKOUTP
0.25
0.39
ns
(1)
CLOAD is the effective external single-ended load capacitance between each output pin and ground
(2)
RLOAD is the differential load resistance between the LVDS output pair.
(3)
At higher frequencies, tPDI is greater than one clock period and overall latency = ADC latency + 1.
(4)
Measurements are done with a transmission line of 100-
Ω characteristic impedance between the device and the load. Setup and hold
time specifications take into account the effect of jitter on the output data and clock.
(5)
Data valid refers to LOGIC HIGH of +100.0 mV and LOGIC LOW of -100.0 mV.
Copyright 2011–2012, Texas Instruments Incorporated
ELECTRICAL SPECIFICATIONS
15
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