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Copyright ARM Limited 1997, 1998, 2000. All rights reserved.
ARM DDI 0192A
Figure 6-3
Figure 6-4
Figure 6-5
Figure 6-6
Figure 6-7
Figure 6-8
Figure 6-9
Figure 7-1
Figure 7-2
Figure 7-3
Figure 7-4
Figure 7-5
Figure 7-6
Figure 7-7
Figure 7-8
Figure 7-9
Figure 7-10 Output enable and disable times due to data scanning...................... 7-37
Figure 8-1
ARM7TDMI TAP controller and EmbeddedICE.................................... 8-2
Figure 8-2
EmbeddedICE block diagram............................................................... 8-5
Figure 8-3
Watchpoint control value and mask format .......................................... 8-6
Figure 8-4
Debug control register format............................................................. 8-13
Figure 8-5
Debug status register format .............................................................. 8-15
Figure 8-6
Debug control and status register structure........................................ 8-16
Figure 8-7
Debug comms control register............................................................ 8-19
Figure 9-1
Conceptual device clocking using the fastbus extension ..................... 9-3
Figure 9-2
Conceptual device clocking in standard mode ..................................... 9-5
Figure 9-3
Relationship of FCLK and BCLK in synchronous mode....................... 9-7
Figure 10-1 Simple single-cycle access................................................................. 10-4
Figure 10-2 Simple sequential access................................................................... 10-5
Figure 10-3 Minimum interval between bus accesses........................................... 10-6
Figure 10-4 Use of the BWAIT pin to stop ARM720T for 1 BCLK cycle .............. 10-11
Figure 10-5 Little-endian addresses of bytes within words.................................. 10-14
Figure 10-6 Big-endian addresses of bytes within words .................................... 10-15
Figure 10-7 Bus master handover ....................................................................... 10-19
Figure 11-1 Running a test vector on the processor core...................................... 11-2
Figure 11-2 State machine for ARM720T and ARM7TDMI test............................. 11-3
Figure 11-3 .State machine for RAM test mode..................................................... 11-6
Figure 11-4 State machine for TAG test mode ...................................................... 11-8
Figure 11-5 State machine for MMU test mode................................................... 11-10
Figure 12-1 ETM interface signal timing ................................................................ 12-3
Figure 12-2 ETMCLK power saving....................................................................... 12-4
Level 1 descriptors ............................................................................... 6-7
Section translation.............................................................................. 6-11
Page table entry, level 2 descriptor .................................................... 6-12
Small page translation........................................................................ 6-15
Large page translation........................................................................ 6-17
Domain access control register format............................................... 6-21
Sequence for checking faults ............................................................. 6-22
Typical debug system........................................................................... 7-4
ARM7TDM scan chain arrangement .................................................... 7-6
Test access port (TAP) controller state transitions............................. 7-10
ID code register format....................................................................... 7-16
Input scan cell..................................................................................... 7-19
Clock switching on entry to debug state............................................. 7-24
Scan general timing............................................................................ 7-35
Reset period timing............................................................................. 7-36
Output enable and disable times due to HIGHZ TAP instruction ....... 7-36