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| 型號： | 1215E |
| 英文描述： | TEST/JTAG SUPPORT|CMOS|QFP|48PIN|PLASTIC |
| 中文描述： | 測試/ JTAG支持|的CMOS | QFP封裝| 48PIN |塑料 |
| 文件頁數： | 10/92頁 |
| 文件大小： | 1041K |
| 代理商： | 1215E |
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18
Agere Systems Inc.
User Manual
April 2001
Advanced Operational Mode
497AE and 1215E Boundary-Scan Master 2
Automatic Test Pattern Generation (ATPG), Scan Sequence Modification (SSM),
and Signature Analysis (continued)
Scan-Sequence Modifier (SSM) (continued)
SSM—Deterministic Mode with SAR as TDI Destination
The SSM serves a dual purpose. Not only does it select the appropriate source for data to be shifted out of the
BSM2, it also has the information needed to select those bits in the stream of data being scanned into the BSM2
that correspond to bits sampled by input cells on the selected/attached B-S chain. To aid in understanding how this
works, an important fact to observe is that, at any instant, when a test vector is being shifted into a selected/
attached B-S chain, the B-S cell whose value is being shifted out of the BSM2 at TDO and into the B-S chain is the
same B-S cell which has its previously captured response (if any) being shifted out of the B-S chain and into the
BSM2, at TDI. For this reason, the TVI/TVO map that identifies the cell type and controls the value shifted into the
selected/attached B-S chain, also identifies the cell type of the cell that is the origin of the bit that is being shifted
out of the B-S chain and into the BSM2. Consequently, when an input cell is identified, as described above, the
SAR is enabled and the bit value is taken as part of the data stream to be compressed. When the cell is identified
as control or output, the SAR is disabled for that bit.
WARNING: When using ATPG, it is important to set autoincrementing on for both TVO and TVI. Otherwise,
the first word of the maps in the two buffers will be used over and over as a map for the entire
scan path. This may lead to undesirable changes of state in control cells along the B-S path
with subsequent damage to the product.
When the BSM2 is used in normal (deterministic) scan operation with SAR as TDI destination, the output vectors,
stored in TVO, are assumed to be correctly formatted so that no conflicts occur. Hence, the problem is limited to
identifying the cells that have useful test information. When serial response vectors are to be compressed, TVI is
used to store this information. A 1 in a location in TVI enables the SAR, and the information in the cell at the corre-
sponding scan path location is compressed (Table 2). This feature can be used to identify the position of the input
cells during interconnect test using the EXTEST instruction combined with signature analysis.
Note:
The retimed delay function is not applicable to scan operation in which the SAR is the target for
data scanned into TDI.
The table below defines the operation of the SSM and its interaction with SAR in this mode.
Table 2. Deterministic Mode with SSM Enabled: How ith Bit of TVI Encodes Source Cell in B-S Chain and
Directs Operation of SAR
ATPG: Hardware Generation of Test Sequences
This section describes the hardware support provided by the BSM2 for generating a set of commonly used test
vector sequences. The BSM2 provides support for generating the following sequences in ATPG mode:
s
Walking-ones (walking-zeros) sequence
s
Upcount (downcount) sequence
s
Pseudorandom sequence (and its complement)
s
Constant 1 (or 0) output
Source of Test Stimulus
Receiving Test Output
TVI(i)
SAR
TVO(i)
SAR
1
enable
TVO(i)
SAR
0
disable
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