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| 型號： | 1215E |
| 英文描述： | TEST/JTAG SUPPORT|CMOS|QFP|48PIN|PLASTIC |
| 中文描述： | 測試/ JTAG支持|的CMOS | QFP封裝| 48PIN |塑料 |
| 文件頁數： | 6/92頁 |
| 文件大小： | 1041K |
| 代理商： | 1215E |
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14
Agere Systems Inc.
User Manual
April 2001
Advanced Operational Mode
497AE and 1215E Boundary-Scan Master 2
The BSM2 Scan Process (continued)
Recirculation Scan
Using the TIOM[2:0] bits of the CUTI register, it is pos-
sible to program the BSM2 to directly connect its TDI
input to its TDO output within the device.
There are two types of recirculating scan—recirculate
mode (TIOM[2:0]=101) and recirculate mode with
response only (TIOM[2:0]=111).
The Test Data Memories (FIFOs) are disconnected,
and data that was in the selected/attached B-S chain
when recirculating scan began is recycled through the
chain for the programmed number of bits. During the
recirculating scan, the BSM2 adds no delay to the scan
chain—a B-S chain of
n cells recirculates in n cycles of
the TCK clock signal.
The recirculate mode is useful for manual debugging of
B-S chains. The following approach was provided by
an experienced BSM (497AA) user and is equally
applicable in the case of BSM2.
First, a standard data scan is used to preload all scan
flip-flops in the B-S chain. This scan operation is termi-
nated in the Pause-DR TAP Controller state. Because
of software performing I/O to the BSM2, this data scan
is bursty—the host computer cannot keep the pipe
flushed; TAP Controllers in the B-S chain move from
Shift-DR to Pause-DR, back to Shift-DR, etc., until all
of the data has been scanned in. Once the scan chain
is preloaded, the recirculate mode (without storing
response) is employed. By executing a scan operation
in the recirculate mode, the BSM2 causes all the TAP
Controllers on the selected/attached B-S chain to enter
the Shift-DR TAP Controller state and remain in that
TAP Controller state for the total number of scan bits.
The TAP leads of individual devices can then be
probed with a scope to detect and display the serial bit
pattern in its entirety. The TMS signal is used to gate
monitoring of the TDO/TDI data.
In the case of the recirculate mode with response only,
a common application is the upload of functional data
via a processor/controller with a TAP; just as applying
stimulus while ignoring results (TIOM[2:0]=000) opti-
mizes download times, recirculate mode with response
only optimizes upload times.
B-S Chain Selection
The BSM2 supports a test architecture in which there
are multiple B-S chains. The BSM2 can be pro-
grammed to select one of such B-S chains using the
ASP protocol and interface definition (e.g., supporting
TI’s Addressable Scan Port devices).
Retimed Delay Support
In some applications of B-S, there can be selected/
attached chains that are physically distant from the
BSM2. In these cases, clock skew between the signals
of the TAP may become a problem. In order to alleviate
the difficulty, designers may add intermediate latches
(the same number for each BSM2 output signal) to
deskew (retime) the signals (typically, TMS, TDO, and
TDI). Each of the
n latches in a given signal path will
create one cycle of delay in the signal.
At the destination B-S chain, this is not a problem. The
TMS and TDO signals will still be synchronized. The
distant B-S chain will operate as if it were directly
attached to TMS and TDO (after a delay of
n cycles).
The distant B-S chain will produce signals on the line
driving the TDI signal of the BSM2. However, on the
return path, the sequence of bits on the TDI signal will
be delayed by the
m latches in the TDI signal deskew-
ing circuitry. The result is that the TDI signal is shifted
by
n + m cycles, where n + m is the total number of the
latches in the signal path. The BSM can be pro-
grammed to take this delay into account when captur-
ing the serial vectors scanned from the distant B-S
chain.
The BSM2 can adjust to up to 13 latches in the
deskewing circuitry by phase delaying the TDI signal
by the value of the RTD bits. The programming of
these bits is detailed in the discussion of the CSC reg-
ister.
Note:
The retimed delay support function applies
only to scan operations when the TVI FIFO is
selected as the target for input from TDI. It
does not apply when the target for incoming
scan data is the SAR.
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